Diode-Pumped 214.8-nm Nd:YAG /Cr 4 +:YAG Microchip Laser System for the Detection of NO

Autor: Wormhoudt, J., Shorter, J. H., Cook, C. C., Zayhowski, J. J.
Zdroj: Applied Optics; August 2000, Vol. 39 Issue: 24 p4418-4424, 7p
Abstrakt: A passively Q-switched 214.8-nm Nd:YAG/Cr^4+:YAG microchip laser system for the detection of NO was designed, constructed, and tested. The system uses the fifth harmonic of the 1.074-μm transition in Nd:YAG to detect NO by laser-induced fluorescence. A significant challenge was the development of an environmentally stable coating to provide the necessary discrimination between the 1.074-μm laser line and the stronger transition at 1.064 μm. The exact position of the fifth-harmonic frequency was determined by use of NO fluorescence excitation spectra to be 46556 ∓ 1.5 cm^−1. With a pulse energy of approximately 50 nJ of fifth-harmonic light, we observed a detection sensitivity for NO of approximately 15 parts per billion by volume in a simple, compact optical system.
Databáze: Supplemental Index