| Autor: |
Shpeĭzman, V., Peschanskaya, N., Yakushev, P., Smolyanskiĭ, A., Shvedov, A., Cheremisov, V. |
| Zdroj: |
Physics of the Solid State; February 2010, Vol. 52 Issue: 2 p265-270, 6p |
| Abstrakt: |
Abstract: Development of deformation jumps in the creep of poly(methyl methacrylate) (PMMA) has been studied. The structural levels of deformation have been determined from the creep rate oscillation periods (deformation jumps) measured by the interferometric method. Special attention is given to a new method of data processing, which enables one to reveal previously undetectable nanoscale deformation jumps. By the example of PMMA specimens preliminarily exposed to γ radiation with doses D=55–330 kGy and unexposed specimens, the presence of nanoscale deformation jumps with the values dependent on the dose D and time of creep has been shown. The obtained results confirm the existence of 10–20-nm domains in amorphous polymers and make it possible to study the multilevel organization of the deformation process, starting from the nanoscale. |
| Databáze: |
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