| Autor: |
Browder, James Steve, McCurry, Max E., Ballard, Stanley S. |
| Zdroj: |
Applied Optics; February 1984, Vol. 23 Issue: 4 p537-540, 4p |
| Abstrakt: |
Capacitance cells have been designed and constructed for measuring the low-frequency dielectric constant of nonmetallic samples such as optical materials. One equipment covers the 80–300-K temperature range and the other, the 300–500-K range. Data are reported for optical materials CaF_2, KCl, ZnS, and MgF_2 (measured parallel to c axis) and a reference material: Teflon sheet. Only Teflon has been measured in both temperature ranges. A special feature of the equipment is that the dielectric cell can easily be replaced by a cell adapted to measure the linear thermal expansion of appropriate samples through the same temperature ranges, and these measurements permit improved determinations of the temperature coefficient of the dielectric constant. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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