| Autor: |
Sung, C. C., Stettler, J. D., Kuo, T. L. |
| Zdroj: |
Applied Optics; March 1981, Vol. 20 Issue: 6 p963-967, 5p |
| Abstrakt: |
The probability density function P(I) of the integrated intensity I, reflected from a moderately rough surface, is computed correct to order (2πσ/λ)^2, where σ is the rms of the surface roughness z(x), and λ is the incident wavelength. By using the assumption that z(x) is a Gaussian random variable, we obtain P(I) as a function of the size of the detector aperture and the correlation length of the surface roughness. Numerical results and a comparison with previous works are given. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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