Nanocrystal MOS with Silicon-Rich Oxide

Autor: Crupi, I., Lombardo, Salvatore, Gerardi, C., Fazio, B., Vulpio, M., Rimini, Emanuele, Melanotte, M.
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; November 2001, Vol. 82 Issue: 1 p675-680, 6p
Abstrakt: Not Available
Databáze: Supplemental Index