Critical Thickness Threshold in HfO2 Layers
Autor: | Besson, Pascal, Loup, Virginie, Salvetat, Thierry, Rochat, Névine, Lhostis, Sandrine, Favier, Sylvie, Dabertrand, Karen, Cosnier, Vincent |
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Zdroj: | Diffusion and Defect Data Part B: Solid State Phenomena; November 2007, Vol. 134 Issue: 1 p67-70, 4p |
Abstrakt: | Not Available |
Databáze: | Supplemental Index |
Externí odkaz: |