Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides
Autor: | Fursenko, O.V., Semikina, T.V., Shmyrjeva, A.N. |
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Zdroj: | Diffusion and Defect Data Part B: Solid State Phenomena; December 1998, Vol. 63 Issue: 1 p341-346, 6p |
Abstrakt: | Not Available |
Databáze: | Supplemental Index |
Externí odkaz: |