Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides

Autor: Fursenko, O.V., Semikina, T.V., Shmyrjeva, A.N.
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; December 1998, Vol. 63 Issue: 1 p341-346, 6p
Abstrakt: Not Available
Databáze: Supplemental Index