Infrared Studies of Oxygen Precipitation Related Defects in Silicon after Various Thermal Treatments
| Autor: | Vanhellemont, Jan, Kissinger, G., Clauws, Paul, Kaniava, A., Libezny, M., Gaubas, Eugenijus, Simoen, Eddy, Richter, Hans, Claeys, C. |
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| Zdroj: | Diffusion and Defect Data Part B: Solid State Phenomena; July 1995, Vol. 47 Issue: 1 p229-236, 8p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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