The Influence of Diffusion-Related Mechanisms in Limiting Oxide-Scale Failure
Autor: | Evans, Hugh E., Nicholls, John R., Saunders, Stuart R.J. |
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Zdroj: | Diffusion and Defect Data Part B: Solid State Phenomena; February 1995, Vol. 41 Issue: 1 p137-156, 20p |
Abstrakt: | Not Available |
Databáze: | Supplemental Index |
Externí odkaz: |