The Influence of Diffusion-Related Mechanisms in Limiting Oxide-Scale Failure

Autor: Evans, Hugh E., Nicholls, John R., Saunders, Stuart R.J.
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; February 1995, Vol. 41 Issue: 1 p137-156, 20p
Abstrakt: Not Available
Databáze: Supplemental Index