Metal Gettering by Defective Regions in Carbon-Implanted Silicon

Autor: Kögler, R., Kaschny, J.R., Yankov, R.A., Werner, P., Danilin, A.B., Skorupa, Wolfgang
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; July 1997, Vol. 57 Issue: 1 p63-68, 6p
Abstrakt: Not Available
Databáze: Supplemental Index