Gettering in Advanced Low Temperature Processes

Autor: Sadamitsu, S., Ogushi, S., Koike, Y., Reilly, N., Nagashima, T., Sano, Mizuka, Tsuya, H.
Zdroj: Diffusion and Defect Data Part B: Solid State Phenomena; July 1997, Vol. 57 Issue: 1 p53-62, 10p
Abstrakt: Not Available
Databáze: Supplemental Index