Characterization of MBE Grown Si/Si1-xGex/Si Structures Using n+p-Diodes
| Autor: | Schmalz, K., Rücker, H., Grimmeiss, Hermann G., Dietrich, B., Frankenfeld, H., Mehr, W., Osten, H.J., Schley, P. |
|---|---|
| Zdroj: | Diffusion and Defect Data Part B: Solid State Phenomena; December 1993, Vol. 32 Issue: 1 p595-600, 6p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
| Externí odkaz: |
|