Microstructure Characterization and Dielectric Properties of La4Mg3W3O18 Layered Oxide

Autor: Khalyavin, Dimitry D., Senos, Ana Maria R., Mantas, Pedro Q.
Zdroj: Materials Science Forum; May 2006, Vol. 514 Issue: 1 p255-258, 4p
Abstrakt: The microstructure development and the dielectric properties of La4Mg3W3O18 layered oxide were investigated. A strong anisotropic grain growth is revealed in ceramics sintered above 1400oC. The anisotropy of the grain reflects the anisotropic character of the crystal structure. Dielectric measurements yield a relative dielectric permittivity, ε, and a temperature coefficient of the dielectric permittivity, TC ε, to be 21 and 95 ppm K-1, respectively. The positive value of TC ε is assumed to be caused by the octahedral tilting by analogy with the behaviour of other complex ordered perovskites.
Databáze: Supplemental Index