Properties and Suitability of 4H-SiC Epitaxial Layers Grown at Different CVD Systems for High Voltage Applications

Autor: Thomas, Bernd, Bartsch, Wolfgang, Stein, René A., Schörner, Reinhold, Stephani, Dietrich
Zdroj: Materials Science Forum; June 2004, Vol. 457 Issue: 1 p181-184, 4p
Abstrakt: Not Available
Databáze: Supplemental Index