High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
| Autor: | Seitz, Christoph, Rempel, Al., Magerl, Andreas, Gomm, M., Sprengel, W., Schaefer, Hans Eckhardt |
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| Zdroj: | Materials Science Forum; September 2003, Vol. 433 Issue: 1 p289-292, 4p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
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