Minimization of Electric Field Enhancement at Electrode Edge by Surface High Resistive Layer in Ti/4H-SiC Schottky Barrier Diode
Autor: | Ohtsuka, Ken Ichi, Sugimoto, Hiroshi, Kinouchi, Shin Ichi, Tarui, Yoichiro, Imaizumi, Masayuki, Takami, Tetsuya, Ozeki, Tatsuo |
---|---|
Zdroj: | Materials Science Forum; April 2002, Vol. 389 Issue: 1 p1165-1168, 4p |
Abstrakt: | Not Available |
Databáze: | Supplemental Index |
Externí odkaz: |