New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
| Autor: | Bermig, G., Tobisch, J., Richter, K., Helming, Kurt |
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| Zdroj: | Materials Science Forum; January 1993, Vol. 133 Issue: 1 p163-168, 6p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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