Two-Electron Capture in Semiconductors with Deep Defects
| Autor: | Bagraev, N.T., Kolchanova, N.M., Mashkov, V.A., Polovtsev, Igor S. |
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| Zdroj: | Materials Science Forum; January 1991, Vol. 38 Issue: 1 p1361-1366, 6p |
| Abstrakt: | Not Available |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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