| Autor: |
Ivanov, D. A., Amalou, Z., Magonov, S. N. |
| Zdroj: |
Macromolecules; December 2001, Vol. 34 Issue: 26 p8944-8952, 9p |
| Abstrakt: |
High-temperature atomic force microscopy (AFM) was used for in-situ monitoring of melt−crystallization of poly(ethylene terephthalate) (PET) at 233 °C. The observed evolution of the lamellar structure allowed identification of the stack thickening process at the secondary crystallization stage. This finding explains the puzzling decrease of the small-angle X-ray scattering (SAXS) long period observed during isothermal annealing of PET. The quantitative analysis of high-temperature AFM images provides statistically meaningful parameters for the semicrystalline structure and an accurate choice of a structural model for the interpretation of SAXS data. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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