Using atomic-emission and atomic-absorption spectroscopy to analyze semiconductor materials

Autor: Aver'yanov, I. S., Zakharov, L. S., Makarov, A. S., Belozerov, A. F., Vandyukov, E. A., Safin, A. I., Badrutdinova, G. Z., Izotova, I. G., Ostanin, A. A.
Zdroj: Journal of Optical Technology; December 2000, Vol. 67 Issue: 12 p1078
Databáze: Supplemental Index