Using atomic-emission and atomic-absorption spectroscopy to analyze semiconductor materials
Autor: | Aver'yanov, I. S., Zakharov, L. S., Makarov, A. S., Belozerov, A. F., Vandyukov, E. A., Safin, A. I., Badrutdinova, G. Z., Izotova, I. G., Ostanin, A. A. |
---|---|
Zdroj: | Journal of Optical Technology; December 2000, Vol. 67 Issue: 12 p1078 |
Databáze: | Supplemental Index |
Externí odkaz: |