| Autor: |
Paik, Young Hyun, Pan, Jang H., Yoon, Wu J. |
| Zdroj: |
Journal of Colloid and Interface Science; December 2001, Vol. 244 Issue: 2 p444-446, 3p |
| Abstrakt: |
Interfacial charge in a metal oxide–liquid metal system is mainly due to the electron transfer between two phases. Many metal oxides accompany electronic defects, such as quasi-free electrons or holes in their lattices. When those oxides are brought into contact with a liquid metal, electrons in the oxide may transfer to the liquid metal phase, giving rise to an electrical double layer with a flat diffuse layer extended far into the bulk liquid metal phase. In this report, a new method based on the induced electromotive force (emf) is introduced to determine the excess electron density of the diffuse layer. The induced emf is simply generated by rotating a cell of liquid metal containing excess electrons in a solenoid and is only a function of the excess electron density and the rate of rotation velocity of the cell. For systems of NiO and Al2O3particles dispersed in Hg, oxides carried the positive charges on their surfaces by providing electrons for Hg. The excess electron densities in Hg were measured to be about 4.7×1023electrons/m3of Hg for NiO and 2.6×1023electrons/m3of Hg for Al2O3with a solid density of 1.1 wt% at room temperature. |
| Databáze: |
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