Thickness of the layer of sorption developer in capillary inspection

Autor: Prokhorenko, P. P., Migun, N. P., Konovalov, G. E.
Zdroj: Journal of Engineering Physics and Thermophysics; August 1986, Vol. 51 Issue: 2 p972-979, 8p
Abstrakt: The article introduces and analyzes expressions for determining the thickness of the layer of developer applied to the inspected solid body for revealing surface flaws of different shape by methods of capillary flaw detection.
Databáze: Supplemental Index