In situ examination of radiation-induced internal stress relaxation in the column of a high-voltage electron microscope
Autor: | Novikov, I. I., Ermishkin, V. A., Zharkov, V. G., Samoilov, E. N., Lupakov, I. S., Rodchenkov, B. S. |
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Zdroj: | Atomic Energy; March 1984, Vol. 56 Issue: 3 p147-150, 4p |
Databáze: | Supplemental Index |
Externí odkaz: |