In situ examination of radiation-induced internal stress relaxation in the column of a high-voltage electron microscope

Autor: Novikov, I. I., Ermishkin, V. A., Zharkov, V. G., Samoilov, E. N., Lupakov, I. S., Rodchenkov, B. S.
Zdroj: Atomic Energy; March 1984, Vol. 56 Issue: 3 p147-150, 4p
Databáze: Supplemental Index