| Autor: |
Gimelfarb, F. A., Komissarov, L. Yu. |
| Zdroj: |
Fresenius' Journal of Analytical Chemistry; January 1989, Vol. 335 Issue: 1 p117-123, 7p |
| Abstrakt: |
Effects of ‘heterogeneous background’ and ‘phase intensity’ based on own research work of the authors are concerned with quantitative local analyses of heterogeneous materials and are illustrated with the examples of X-ray microanalysis (XMA, or X-ray electron probe microanalysis, EPMA), cathodoluminescent microanalysis (CLMA) and secondary-ion mass-spectroscopy (SIMS). The possibilities of correction or elimination of these effects, new methods for local quantitative distribution analysis and trends in elaboration of local analyses for heterogeneous materials are also discussed. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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