Measuring the thickness of thin transparent films by means of a type MII-4 interferometer
| Autor: | Miloslavskii, V. K., Ryazanov, A. N. |
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| Zdroj: | Measurement Techniques; April 1974, Vol. 17 Issue: 4 p548-551, 4p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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