An apparatus for four-probe specific resistance measurement on epitaxial silicon films
| Autor: | Batavin, V. V., Pantuev, V. S., Prilipko, V. I. |
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| Zdroj: | Measurement Techniques; November 1974, Vol. 17 Issue: 11 p1753-1754, 2p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
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