| Autor: |
Olmstead, M. A., Amer, N. M., Kohn, S., Fournier, D., Boccara, A. C. |
| Zdroj: |
Applied Physics A: Materials Science & Processing; November 1983, Vol. 32 Issue: 3 p141-154, 14p |
| Abstrakt: |
We present a sensitive technique for determining the optical and thermal properties of solids, surfaces and thin films. This technique, photothermal displacement Spectroscopy, is based on the detection of the thermal expansion of a sample upon absorption of electromagnetic radiation. The technique is well suited for in situ ultrahigh vacuum studies and for experiments where wide temperature ranges are required. We show that surface and bulk optical absorption can be distinguished and that surface absorptions of aL=10-6/W of incident power can be measured. The theoretical basis of the signal generation is given, and excellent experimental and theoretical agreement is demonstrated. The implications of our findings to imaging and microscopy are discussed. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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