| Autor: |
Hobbs, B. S., Keily, T., Palmer, A. G. |
| Zdroj: |
Journal of Applied Electrochemistry; July 1978, Vol. 8 Issue: 4 p305-311, 7p |
| Abstrakt: |
The use of sealed nickel-cadmium cells for single duty cycle applications involves certain novel features for which little or no quantitative knowledge exists. The investigations presented in this series of papers have sought answers to the questions raised in broad terms. This first paper considers the effects of long term storage (up to 10 years), in the short-circuited condition, at temperatures ranging between -40–+70° C. An accelerated test procedure was formulated to determine charge acceptance degradation of cells after storage for any given period and temperature. The results indicate that storage effects will constitute a major problem area for nickel-cadmium cells in these applications. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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