| Autor: |
Devadas, Srinivas, Keutzer, Kurt, Malik, Sharad |
| Zdroj: |
Journal of Electronic Testing; February 1993, Vol. 4 Issue: 1 p91-104, 14p |
| Abstrakt: |
Because of its inherent complexity, the problem of automatic test pattern generation for multiple stuck-at faults (multifaults) has been largely ignored. Recently, the observation that multifault testability is retained by algebraic factorization demonstrated that single fault (and therefore multifault) vector sets for two-level circuits could give complete multifault coverage for multilevel circuits constructed by algebraic factorization. Unfortunately, in using this method the vector set size can be much larger than what is really required to achieve multifault coverage, and the approach has some limitations in its applicability. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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