| Autor: |
Sharat Singh, N K, Nandakumar Sarma, H |
| Zdroj: |
Resonance; June 2005, Vol. 10 Issue: 6 p60-69, 10p |
| Abstrakt: |
The characteristic X-rays coming out from an unknown sample due to the irradiation of gamma rays or X-ray photons or due to the bombardment of high velocity protons are used for elemental analysis in a sample. We describe here two techniques viz., Energy Dispersive X-Ray Fluorescence (EDXRF) and Proton Induced X-ray Emission (PIXE) which have the capability of nondestructive and multi-elemental analysis of the sample. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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