Measuring the roughness of high-precision quartz substrates and laser mirrors by angle-resolved scattering
| Autor: | Azarova, V. V., Dmitriev, V. G., Lokhov, Yu. N., Malitskii, K. N. |
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| Zdroj: | Journal of Optical Technology; February 2002, Vol. 69 Issue: 2 p125 |
| Databáze: | Supplemental Index |
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