Variation of even-odd charge effects with excitation energy in ν(a) and mass yield for 252Cf(sf)
| Autor: | Walsh, R. L. |
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| Zdroj: | Radiation Effects and Defects in Solids; March 1986, Vol. 93 Issue: 1 p21-24, 4p |
| Abstrakt: | The existence of even-odd charge effects (fine structure) in ν(A) for 252Cf(sf) has been confirmed. The fine structure is seen to increase in amplitude as the fragment excitation energy decreases, a behaviour similar to that of the mass yield curve. |
| Databáze: | Supplemental Index |
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