Autor: |
Wilson, A. R., Spargo, A. E. C. |
Zdroj: |
Philosophical Magazine A; September 1982, Vol. 46 Issue: 3 p435-449, 15p |
Abstrakt: |
The validity of using the technique of periodic continuation for calculation of the electron diffraction pattern for single-crystal defects has been investigated. Conditions under which the calculated results are directly related to the experimental results have been obtained but it is shown that, in general, there is no obvious relationship. A technique involving more than one set of calculations has been derived which then enables the extraction of the single-defect result. Sample calculations for a simple stacking fault, confirm the results. |
Databáze: |
Supplemental Index |
Externí odkaz: |
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