Electron paramagnetic resonance studies of intrinsic semiconductor UMo6S8: Evidence for dynamically averaged resonance of U4+and conduction electrons

Autor: Kadam, R.M., Sastry, M.D., Iyer, R.M., Gopalakrishnan, I.K., Yakhmi, J.V.
Zdroj: Philosophical Magazine B; April 1997, Vol. 75 Issue: 4 p503-508, 6p
Abstrakt: AbstractOur electron paramagnetic resonance (EPR) investigation of the intrinsic semiconductor UMo6S8in the temperature range 10-100 K has revealed the resonance due to U4+with a strong temperature-dependent gshift. This is due to the dynamic averaging of EPR signals between the static 5f2state of U4+and the conduction electrons. The energy gap ΔEg, between the U 5f levels and the conduction band in UMo6S8can be estimated from the temperature dependence of the gshift to be 0.0165eV.
Databáze: Supplemental Index