Autor: |
Van Dam, C., Van Ham, F. P. G. M., Groen, F. H., Moerman, I., Van Der Tol, J. J. G. M., Smit, M. K. |
Zdroj: |
Fiber & Integrated Optics; January 1997, Vol. 16 Issue: 1 p83-87, 5p |
Abstrakt: |
With the increasing scale of integration, resulting in a higher on-chip complexity, waveguide crossings with good performance are becoming increasingly important. Worst-case paths contain a high number of crossings, depending on the number of channels being processed, in switching matrices [11, multiwavelength add drop filters [2] (up to 151, and optical cross-connects [3]. Crossings with very low crosstalk and loss can be realized in fiber-matched waveguide structures as used in lithium niobate or silica-based technology [4,5]. In highly integrated semiconductor devices, crossings may contribute significantly to the loss and crosstalk performance. In this paper we present the results of a series of experiments for the design of high-performance semiconductor waveguide crossings. |
Databáze: |
Supplemental Index |
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