Uniform large-area x-ray imaging at 9 keV using a backlit pinhole

Autor: Workman, Jonathan, Fincke, James R., Kyrala, George A., Pierce, Tim
Zdroj: Applied Optics; February 2005, Vol. 44 Issue: 6 p859-865, 7p
Abstrakt: The development and application of point backlighting at high x-ray energies is an essential step in diagnosing radiation-driven experiments. The point-backlighting technique provides uniform backlighter irradiance over a large field of view. This technique circumvents the large laser energy required for area backlighters at energies of 9 keV and above. We present the results of a Zn 9 keV point-backlighter source using the technique of pinhole aperturing to define the source size and hence the resolution. Details of the design and application of this technique to an undriven gold-walled hohlraum are described.
Databáze: Supplemental Index