| Autor: |
Cullis, A. G., Hutchison, J. L., Hernández, F., Casals, O., Vilà, A., Morante, J. R., Romano-Rodriguez, A., Abid, M., Abid, J.- P., Valizadeh, S., Hjort, K., Collin, J.- P., Jouati, A. |
| Zdroj: |
Microscopy of Semiconducting Materials; 2005, p291-294, 4p |
| Abstrakt: |
A dual-beam focused ion beam unit has been used to deposit platinum contacts on nanomaterials using both electron- and ion-assisted deposition. Characterization of deposited platinum has been performed and the feasibility of using these nanocontacts to extract electrical parameters of materials demonstrated. The advantage of combining electron- and ion-assisted deposition is discussed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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