| Abstrakt: |
During the last decade soft X-ray emission with resonant excitation using synchrotron radiation has emerged as a new and powerful tool for studies of the electronic structure of materials. The selective probing of this spectroscopy together with its ability to probe bulk properties and buried structures, which also offers in situ-probing capabilities, makes it a unique method for many problems in materials science and chemical physics. In particular, the finding and recognition of the consequences—that resonant X-ray emission is essentially an inelastic scattering process (RIXS)—has led to new and important opportunities for this spectroscopic method. For example, direct probing of dd, ff and charge transfer low energy excitations in strongly correlated materials, using virtual core holes for element and site specificity without suffering from core-hole lifetime broadening, is elegantly offered by this method. The present overview of soft X-ray emission spectroscopy applications in solid state physics and materials science included a brief description of the experimental technique, and a number of study cases from different fields. Investigations of thin films and buried structures, nano materials, transition metal and rare earth systems, as well as lanthanides and actinides were discussed. Furthermore, molecular systems were discussed in terms of basic probing properties, and, finally, applications to the study of liquids were presented and discussed. [ABSTRACT FROM AUTHOR] |
