Standardization of Chemically Selective Atomic Force Microscopy for Metal Oxide Surfaces.

Autor: Wiesener, Philipp, Förster, Stefan, Merkel, Milena, Schulze Lammers, Bertram, Fuchs, Harald, Amirjalayer, Saeed, Mönig, Harry
Zdroj: ACS Nano; 8/20/2024, Vol. 18 Issue 33, p21948-21956, 9p
Databáze: Supplemental Index