| Autor: |
Wong, Y. W., Yuen, C. W. M., Leung, M. Y. S., Ku, S. K. A., Lam, H. L. I., Chung, Y. S. S. |
| Zdroj: |
Textile Asia; Apr2005, Vol. 36 Issue 4, p45-48, 4p, 6 Diagrams, 3 Graphs |
| Abstrakt: |
This article discusses the common instrumental techniques used to characterise nano-particles and nano-treated materials including scanning electron microscopy, scanning probe microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy. Nanotechinologies have been widely applied to different fields owing to their unique and valuable properties. The unique properties and the improved performance of nano-treated materials are determined according to their sizes, surface morphology and inter-particle interaction. Characterising the properties of individual nano-particle is a challenge to the existing testing and measuring techniques. First, the size of nano-particle is so small that the applications of the existing testing techniques are not appropriate. Second, the small size of the nano-structure complicates their manipulation, special techniques are therefore needed to pick up and install individual nano-structures. The first scanning electron microscope (SEM) was constructed in 1938 by von Ardenn. SEM measures two dimensions of the samples only, which are x and y dimensions. The principle of SEM is to apply a voltage between a conductive sample and filament, resulting in electron emission from the filament to the sample. |
| Databáze: |
Supplemental Index |
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