Direct Imaging of Carrier Funneling in a Dielectric Engineered 2D Semiconductor.

Autor: Gauriot, Nicolas, Ashoka, Arjun, Lim, Juhwan, See, Soo Teck, Sung, Jooyoung, Rao, Akshay
Zdroj: ACS Nano; 1/9/2024, Vol. 18 Issue 1, p264-271, 8p
Databáze: Supplemental Index