| Autor: |
Agethen, M., Reuter, R., Breder, T., Bertenburg, R. M., Brockerhoff, W., Tegude, F. J. |
| Předmět: |
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| Zdroj: |
Encyclopedia of Electrical & Electronics Engineering; 1999 1st Edition, Vol. 14, p392-410, 19p |
| Abstrakt: |
This article discusses various issues related to the high-frequency noise behavior. The high-frequency behavior of electronic devices is of major interest in the field of research and development. The high-frequency noise behavior must be considered for circuit design, especially if noise has a significant influence on system performance. The most important and well-known noise mechanism is thermal noise or Johnson noise. This process can be observed in all electrically conductive materials. The phenomenon of statistical current fluctuations is called shot noise. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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