Nanolayer characterization through wavelength multiplexing of a microsphere resonator.

Autor: Noto, Mayumi, Vollmer, Frank, Keng, David, Teraoka, Iwao, Arnold, Stephen
Zdroj: Optics Letters; 3/1/2005, Vol. 30 Issue 5, p510-512, 3p, 1 Diagram, 2 Graphs
Databáze: Supplemental Index