Statistical Assessment of High-Performance Scaled Double-Gate Transistors from Monolayer WS2.

Autor: Sun, Zheng, Pang, Chin-Sheng, Wu, Peng, Hung, Terry Y.T., Li, Ming-Yang, Liew, San Lin, Cheng, Chao-Ching, Wang, Han, Wong, H.-S. Philip, Li, Lain-Jong, Radu, Iuliana, Chen, Zhihong, Appenzeller, Joerg
Zdroj: ACS Nano; 9/27/2022, Vol. 16 Issue 9, p14942-14950, 9p
Databáze: Supplemental Index