Statistical Assessment of High-Performance Scaled Double-Gate Transistors from Monolayer WS2.
Autor: | Sun, Zheng, Pang, Chin-Sheng, Wu, Peng, Hung, Terry Y.T., Li, Ming-Yang, Liew, San Lin, Cheng, Chao-Ching, Wang, Han, Wong, H.-S. Philip, Li, Lain-Jong, Radu, Iuliana, Chen, Zhihong, Appenzeller, Joerg |
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Zdroj: | ACS Nano; 9/27/2022, Vol. 16 Issue 9, p14942-14950, 9p |
Databáze: | Supplemental Index |
Externí odkaz: |