| Autor: |
Houlihan, Richard, Dhull, Naveen, Fitzgerald, Padraig |
| Předmět: |
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| Zdroj: |
Analog Dialogue; 2022, Vol. 56 Issue 2, p1-4, 4p |
| Abstrakt: |
Advanced digital processor ICs require separate DC parametric and high speed digital automatic test equipment (ATE) passes for quality assurance. This creates significant cost and logistical challenges. This article explains how the ADGM1001 SPDT MEMS switch facilitates a one pass single insertion test for both DC parametric and high speed digital tests, reducing test cost and simplifying logistics for digital/RF system on chip (SoC) testing. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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