Strong Interfacial Charge Trapping in Ultrathin SrRuO3 on SrTiO3 Probed by Noise Spectroscopy.
| Autor: | Lee, Jung-Woo, Kim, Jiyeong, Eom, Kitae, Jeon, Jaeyoung, Kim, Young Chul, Kim, Hwan Sik, Ahn, Yeong Hwan, Kim, Sungkyu, Eom, Chang-Beom, Lee, Hyungwoo |
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| Zdroj: | Journal of Physical Chemistry Letters; 6/23/2022, Vol. 13 Issue 24, p5618-5625, 8p |
| Databáze: | Supplemental Index |
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