Characterization of the Interfacial Toughness in a Novel "GaN-on-Diamond" Material for High-Power RF Devices.
| Autor: | Dong Liu, Fabes, Stephen, Bo-Shiuan Li, Francis, Daniel, Ritchie, Robert O., Kuball, Martin |
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| Zdroj: | ACS Applied Electronic Materials; Mar2019, Vol. 1 Issue 3, p354-369, 16p |
| Databáze: | Supplemental Index |
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