Correction to Structural Tolerance Factor Approach to Defect-Resistant I2‑II-IV‑X4 Semiconductor Design.
| Autor: | Sun, Jon-Paul, McKeown Wessler, Garrett C., Wang, Tianlin, Zhu, Tong, Blum, Volker, Mitzi, David B. |
|---|---|
| Zdroj: | Chemistry of Materials; 7/14/2020, Vol. 32 Issue 13, p5925-5926, 2p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
|