Quantitative local current-voltage analysis with different spatially-resolved camera based techniques of silicon solar cells with cracks.
| Autor: | Pletzer, Tobias M., van Molken, Justus I., Rissland, Sven, Hallam, Brett, Cornagliotti, Emanuele, John, Joachim, Breitenstein, Otwin, Knoch, Joachim |
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| Zdroj: | 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC); 2014, p3473-3478, 6p |
| Databáze: | Complementary Index |
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