Inferring dislocation recombination strength in multicrystalline silicon via etch pit geometry analysis.
| Autor: | Castellanos, Sergio, Hofstetter, Jasmin, Kivambe, Maulid, Rinio, Markus, Lai, Barry, Buonassisi, Tonio |
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| Zdroj: | 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC); 2014, p2957-2959, 3p |
| Databáze: | Complementary Index |
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